Micro Xray fluorescence (MXRF) imaging is a relatively new method to map the constituent elements of a surface to a depth of tens to hundreds of microns, and at high spatial resolution, i.e., 40 to 50 microns. The feasibility of MXRF imaging is investigated as a potential NDE method to detect and characterize spalling failure of chromium disilicide diffusion coatings on Space Shuttle Reaction Control System (RCS) thruster chambers.

Topics
Space instruments, Materials treatment, Transition metals, X-ray fluorescence spectroscopy, Silicide, Spalling
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© 2004 American Institute of Physics.
2004
American Institute of Physics
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