A series of dissolution experiments using isotopic labeled aqueous solution were carried out to investigate the ion exchange mechanism in glasses with fixed and variable concentrations. The sodium removal and the deuterium and oxygen uptake in the glass coupons were measured using ion beam methods such as Rutherford backscattering spectrometry (RBS) and nuclear reaction analysis (NRA). Both RBS and NRA experimental spectra were simulated using the SIMNRA simulation code with a thin layer approximation. Na, D, and concentrations as a function of depth in reacted and non-reacted glasses were determined using simulated spectra. On the basis of the depth distributions of these elements, three different zones (reaction, transition, and diffusion zones) were identified in both samples.
Skip Nav Destination
,
,
,
,
,
,
,
Article navigation
12 July 2001
The CAARI 2000: Sixteenth international conference on the application of accelerators in research and industry
1-5 Nov 2000
Denton, Texas (USA)
Research Article|
July 12 2001
Investigation of alkali ion exchange processes in waste glasses using Rutherford backscattering spectrometry and nuclear reaction analysis
V. Shutthanandan;
V. Shutthanandan
1Pacific Northwest National Laboratory, Richland, Washington 99352
Search for other works by this author on:
S. Thevuthasan;
S. Thevuthasan
1Pacific Northwest National Laboratory, Richland, Washington 99352
Search for other works by this author on:
D. R. Baer;
D. R. Baer
1Pacific Northwest National Laboratory, Richland, Washington 99352
Search for other works by this author on:
E. M. Adams;
E. M. Adams
1Pacific Northwest National Laboratory, Richland, Washington 99352
Search for other works by this author on:
S. Maheswaran;
S. Maheswaran
2School of Science, University of Western Sydney-Nepean, Kingswood, NSW 2747, Australia
Search for other works by this author on:
M. H. Engelhard;
M. H. Engelhard
1Pacific Northwest National Laboratory, Richland, Washington 99352
Search for other works by this author on:
J. P. Icenhower;
J. P. Icenhower
1Pacific Northwest National Laboratory, Richland, Washington 99352
Search for other works by this author on:
B. P. McGrail
B. P. McGrail
1Pacific Northwest National Laboratory, Richland, Washington 99352
Search for other works by this author on:
V. Shutthanandan
1
S. Thevuthasan
1
D. R. Baer
1
E. M. Adams
1
S. Maheswaran
2
M. H. Engelhard
1
J. P. Icenhower
1
B. P. McGrail
1
1Pacific Northwest National Laboratory, Richland, Washington 99352
2School of Science, University of Western Sydney-Nepean, Kingswood, NSW 2747, Australia
AIP Conf. Proc. 576, 454–457 (2001)
Citation
V. Shutthanandan, S. Thevuthasan, D. R. Baer, E. M. Adams, S. Maheswaran, M. H. Engelhard, J. P. Icenhower, B. P. McGrail; Investigation of alkali ion exchange processes in waste glasses using Rutherford backscattering spectrometry and nuclear reaction analysis. AIP Conf. Proc. 12 July 2001; 576 (1): 454–457. https://doi.org/10.1063/1.1395347
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
The implementation of reflective assessment using Gibbs’ reflective cycle in assessing students’ writing skill
Lala Nurlatifah, Pupung Purnawarman, et al.
Inkjet- and flextrail-printing of silicon polymer-based inks for local passivating contacts
Zohreh Kiaee, Andreas Lösel, et al.
Effect of coupling agent type on the self-cleaning and anti-reflective behaviour of advance nanocoating for PV panels application
Taha Tareq Mohammed, Hadia Kadhim Judran, et al.
Related Content
SIMNRA, a simulation program for the analysis of NRA, RBS and ERDA
AIP Conf. Proc. (June 1999)
An experiment on the dynamics of ion implantation and sputtering of surfaces
Rev. Sci. Instrum. (February 2014)
Interface mixing of Al ∕ Fe and Fe ∕ Al bilayer systems and the role of Ti as a stabilizing interlayer using Rutherford backscattering spectrometry and x-ray reflectometry
J. Appl. Phys. (January 2008)
In situ measurement of low-Z material coating thickness on high Z substrate for tokamaks
Rev. Sci. Instrum. (August 2014)