M-shell ionization cross sections for 75–300 keV protons on TM using thick and thin targets

Low energy protons were used to excite M x-rays from elemental targets of Thulium. The x-rays were measured with a high-resolution Si(Li) detector equipped with an ultra-thin window. Separate measurements were taken with a thick target and a thin target. The accuracy and precision of the results using each target will be contrasted and x-ray production cross sections will be compared with the ECPSSR theory (1).