Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics

The application of CVD diamonds as radiation-hard particle detectors with outstanding properties for heavy ion beamline diagnostics is presented. Synchrotron particle spills ranging from a single ion to well beyond $108 pps$ can be analyzed while maintaining single-particle time resolution below fractions of a nanosecond. With segmented electrode structures on the diamond surface, higher particle count rates and improved monitoring of $x/y$ beam profiles can be achieved. Diamond detectors with areas up to $30×30 mm2$ for a precise measurement system for beam intensity, beam profiles, and spill time-structure are described.