The application of CVD diamonds as radiation-hard particle detectors with outstanding properties for heavy ion beamline diagnostics is presented. Synchrotron particle spills ranging from a single ion to well beyond 108pps can be analyzed while maintaining single-particle time resolution below fractions of a nanosecond. With segmented electrode structures on the diamond surface, higher particle count rates and improved monitoring of x/y beam profiles can be achieved. Diamond detectors with areas up to 30×30 mm2 for a precise measurement system for beam intensity, beam profiles, and spill time-structure are described.

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