The application of CVD diamonds as radiation-hard particle detectors with outstanding properties for heavy ion beamline diagnostics is presented. Synchrotron particle spills ranging from a single ion to well beyond can be analyzed while maintaining single-particle time resolution below fractions of a nanosecond. With segmented electrode structures on the diamond surface, higher particle count rates and improved monitoring of beam profiles can be achieved. Diamond detectors with areas up to for a precise measurement system for beam intensity, beam profiles, and spill time-structure are described.
Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics
P. Moritz, E. Berdermann, K. Blasche, H. Rödl, H. Stelzer, F. Zeytouni; Diamond detectors with subnanosecond time resolution for heavy ion spill diagnostics. AIP Conf. Proc. 10 December 1998; 451 (1): 514–521. https://doi.org/10.1063/1.57055
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