An introduction to the use of maximum entropy (ME) and Bayesian methods in ion-beam applications is presented. The formalism is applied to the deconvolution of detector blurring functions in RBS and PIXE measurements. The resulting improvement in detector resolution can be as much as a factor of 5 when the detector functions are well known. The possibilities of further applications in ion-beam related work are also discussed.
The use of maximum entropy and Bayesian statistics in ion-beam applications
V. M. Prozesky, J. Padayachee, R. Fischer, W. von der Linden, V. Dose, C. G. Ryan; The use of maximum entropy and Bayesian statistics in ion-beam applications. AIP Conf. Proc. 5 February 1997; 392 (1): 595–598. https://doi.org/10.1063/1.52523
Download citation file: