The Magnetic Force Microscopy (MFM) combines the advantages of the Atomic Force Microscopy (AFM) with the ability to visualize the surface magnetic domain structure of samples. Higher contrast in the MFM imaging means better ability to see magnetic structures and distinguish them from noise. One of the parameters affecting the MFM image contrast is the free cantilever oscillation amplitude of the probe. In this study, we present MFM measurements performed on a magnetic videotape at two different levels of free cantilever oscillation amplitude. The results showed that scanning at higher amplitude can enhance the signal-to-noise ratio and thus the contrast of the MFM image. Conversely, scanning at lower amplitude increases the perception level of the noise in the image. However, it should be noted that in the scope of our experimental conditions, changes in the image were not significant. In addition, it was found that precise adjustment of the tip-to-surface distance plays a crucial role in this MFM experiment, which is not the same as the “lift height” parameter.

Topics
Signal-to-noise ratio, Magnetic force microscopy, Atomic force microscopy
1.
L.
Yue
 and
S.-H.
Liou
, “Magnetic Force Microscopy Studies of Magnetic Features and Nanostructures” in:
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
, edited by
B.
Bhushan
 (
Springer
,
Berlin
,
2011
), pp.
287
–
319
.
Google Scholar
 
2.
O.
Kazakova
,
R.
Puttock
,
C.
Barton
,
H.
Corte-León
,
M.
Jaafar
,
V.
Neu
, and
A.
Asenjo
,
J. Appl. Phys.
125
(
6
),
060901
(
2019
).
https://doi.org/10.1063/1.5050712
Google Scholar
 
3.
Digital Instruments, “
Magnetic Force Microscopy (MFM): Applicable to Dimension™ Series and MultiMode™ Systems
”,
Support Note No. 229, Rev. B.
,
1996
.
4.
T.
Shinjo
,
T.
Okuno
,
R.
Hassdorf
,
K.
Shigeto
, and
T.
Ono
,
Science
289
,
930
–
932
(
2000
).
https://doi.org/10.1126/science.289.5481.930
Google Scholar
 
5.
M.
Hehn
,
K.
Ounadjela
,
J.-P.
Bucher
,
F.
Rousseaux
,
D.
Decanini
,
B.
Bartenlian
, and
C.
Chappert
,
Science
272
,
1782
–
1785
(
1996
).
https://doi.org/10.1126/science.272.5269.1782
Google Scholar
 
6.
Iu. V.
Vetrova
,
M.
Zelent
,
J.
Šoltýs
,
V. A.
Gubanov
,
A. V.
Sadovnikov
,
T.
Šcepka
,
J.
Dérer
,
R.
Stoklas
,
V.
Cambel
, and
M.
Mruczkiewicz
,
Appl. Phys. Lett.
118
(
21
),
212409
(
2021
).
https://doi.org/10.1063/5.0045835
Google Scholar
 
7.
M.
Liebmann
,
A.
Schwarz
,
S. M.
Langkat
, and
R.
Wiesendanger
,
Rev. Sci. Instrum.
73
(
10
),
3508
–
3514
(
2002
).
https://doi.org/10.1063/1.1502446
Google Scholar
 
8.
P.
Ares
,
M.
Jaafar
,
A.
Gil
,
J.
Gómez-Herrero
, and
A.
Asenjo
,
Small
11
(
36
),
4731
–
4736
(
2015
).
https://doi.org/10.1002/smll.201500874
Google Scholar
 
9.
P.
Grütter
 and
R.
Allenspach
,
Geophys. J. Int.
116
(
2
),
502
–
505
(
1994
).
https://doi.org/10.1111/j.1365-246X.1994.tb01812.x
Google Scholar
 
10.
B.
Vellekoop
,
L.
Abelmann
,
S.
Porthun
, and
C.
Lodder
,
J. Magn. Magn. Mater.
190
(
1-2
),
148
–
151
(
1998
).
https://doi.org/10.1016/S0304-8853(98)00280-7
Google Scholar
 
11.
M.
Pavúk
,
M.
Weis
,
G.
Farkas
, and
V.
Slugeň
, “
Domain structure in thin nickel film observed by low- and high-coercivity Magnetic Force Microscopy probe
” in:
Proceedings of APCOM 2015
, edited by
J.
Vajda
 and
I.
Jamnický
 (
Nakladateľstvo STU
,
Bratislava
,
2015
, ISBN 978-80-227-4373-0), pp.
47
–
50
.
Google Scholar
 
12.
K.
Babcock
,
V.
Elings
,
M.
Dugas
, and
S.
Loper
,
IEEE Trans. Magn.
30
(
6
),
4503
–
4505
(
1994
).
https://doi.org/10.1109/20.334130
Google Scholar
 
13.
P.
Grütter
,
D.
Rugar
,
H. J.
Mamin
,
G.
Castillo
,
S. E.
Lambert
,
C.-J.
Lin
,
R. M.
Valletta
,
O.
Wolter
,
T.
Bayer
, and
J.
Greschner
,
Appl. Phys. Lett.
57
(
17
),
1820
–
1822
(
1990
).
https://doi.org/10.1063/1.104030
Google Scholar
 
14.
L.
Folks
,
M. E.
Best
,
P. M.
Rice
,
B. D.
Terris
,
D.
Weller
,
J. N.
Chapman
,
Appl. Phys. Lett.
76
,
909
–
911
(
2000
).
https://doi.org/10.1063/1.125626
Google Scholar
 
15.
N. H.
Freitag
,
C. F.
Reiche
,
V.
Neu
,
P.
Devi
,
U.
Burkhardt
,
C.
Felser
,
D.
Wolf
,
A.
Lubk
,
B.
Büchner
, and
T.
Mühl
,
Commun. Phys.
6
(
1
),
11
(
2023
).
https://doi.org/10.1038/s42005-022-01119-3
Google Scholar
 
16.
V. B.
Elings
 and
J. A.
Gurley
, U.S. Patent No. 5,308,974 (3 May
1994
).
17.
M.
Precner
,
J.
Fedor
,
J.
Šoltýs
, and
V.
Cambel
,
Nanotechnology
26
(
5
),
055304
(
2015
).
https://doi.org/10.1088/0957-4484/26/5/055304
Google Scholar
 
18.
V.
Cambel
,
D.
Gregušová
,
P.
Eliáš
,
J.
Fedor
,
I.
Kostič
,
J.
Maňka
, and
P.
Ballo
,
JEEEC
62
(
1
),
37
–
43
(
2011
).
Google Scholar
 
19.
T. R.
Albrecht
,
P.
Grütter
,
D.
Horne
, and
D.
Rugar
,
J. Appl. Phys.
69
(
2
),
668
–
673
(
1991
).
https://doi.org/10.1063/1.347347
Google Scholar
 
20.
X.
Zhu
, “
Magnetic Force Microscopy Studies of Submicron and Nanoscale Magnet Arrays
”, Ph.D. thesis,
McGill University
,
2002
.
Google Scholar
 
21.
S. B.
Luitjens
 and
A. M. A
Rijckaert
,
J. Magn. Magn. Mater.
193
(
1-3
),
17
–
23
(
1999
).
https://doi.org/10.1016/S0304-8853(98)00398-9
Google Scholar
 
This content is only available via PDF.
©2024 Authors. Published by AIP Publishing.
2024
Author(s)
You do not currently have access to this content.