In this review, the use of different X-ray fluorescence spectrometry (XRF) techniques and their comparison analysis are summarized. WDXRF and EDXRF are considered to be two distinct modalities of XRF Since it use diffusion techniques and spectrometers that are distinct from one another. The current XRF technique is also in consideration. XRF fluorescence is a great approach to detecting the elemental makeup of earth minerals. This technique’s accuracy, precision, and clear emission spectrum make it useful After the comparison with different classifiers, it comes up the result that the Energy Dispersive X-ray Fluorescence (EDXRF) has the most accurate results, with a 96.99% success rate, while the Inductively Coupled Plasma Optical Emission Spectrometry (ICP-OES) has the least accurate results, with an 83.19% success rate. A significant amount of investigation is currently being conducted in preparation for the creation of the Use of Wavelength Dispersive X-ray Fluorescence (WDXRF) and EDXRF techniques for trace elements. Future advances in XRF devices and preconcentration procedures could give new options for identifying trace elements in liquid samples.
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20 February 2024
3RD INTERNATIONAL CONFERENCE ON FUNCTIONAL MATERIALS, MANUFACTURING, AND PERFORMANCES: ICFMMP2022
29–30 July 2022
Phagwara, India
Research Article|
February 20 2024
Use of EDXRF and WDXRF techniques for trace element analysis: A review
Manpreet Kaur;
Manpreet Kaur
a)
1
Department of Physics(UIS), Chandigarh University
, Gharuan, Mohali, Punjab 140413, India
a)Corresponding author: [email protected]
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Deepak Singh;
Deepak Singh
b)
1
Department of Physics(UIS), Chandigarh University
, Gharuan, Mohali, Punjab 140413, India
Search for other works by this author on:
Amandeep Singh
Amandeep Singh
c)
1
Department of Physics(UIS), Chandigarh University
, Gharuan, Mohali, Punjab 140413, India
Search for other works by this author on:
Manpreet Kaur
1,a)
Deepak Singh
1,b)
Amandeep Singh
1,c)
1
Department of Physics(UIS), Chandigarh University
, Gharuan, Mohali, Punjab 140413, India
AIP Conf. Proc. 2986, 030123 (2024)
Citation
Manpreet Kaur, Deepak Singh, Amandeep Singh; Use of EDXRF and WDXRF techniques for trace element analysis: A review. AIP Conf. Proc. 20 February 2024; 2986 (1): 030123. https://doi.org/10.1063/5.0193317
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