Plagiarism is defined as expressing thoughts or ideas of someone as their own original work. Plagiarism detection systems can improve education quality by assisting teachers in detecting plagiarism. The common technique for a plagiarism detection approach uses a variety of specific metrics to determine incidences of plagiarism. Almost all the plagiarism detection tools are working on the keywords or string matching concepts. The problem exists in such type of concept to detect the plagiarism is that, someone can easily rewrite or reframe the original ideas or thoughts of someone by replacing words or by changing the form of sentences without altering the sense of sentences, So the system those have key idea to detect the plagiarism by matching the keywords available in the sentences or documents not work correctly sometime. This paper presents a method to detect plagiarism on conceptual level by using the concept of text mining. It also focuses on different challenges and issues present in conceptual level plagiarism.
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22 March 2024
ADVANCE COMPUTING AND INGENIOUS TECHNOLOGY IN ENGINEERING SCIENCE
30–31 December 2021
Greater Noida, India
Research Article|
March 22 2024
An efficient approach to detect conceptual level plagiarism using text mining Available to Purchase
Devendra Kumar Mishra;
Devendra Kumar Mishra
a)
1
Amity School of Engineering and Technology, Amity University Madhya Pradesh
, Maharajpura Dang, Gwalior, MP, India
a)Corresponding author: [email protected]
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Arvind Kumar Upadhyay;
Arvind Kumar Upadhyay
b)
1
Amity School of Engineering and Technology, Amity University Madhya Pradesh
, Maharajpura Dang, Gwalior, MP, India
Search for other works by this author on:
Sanjiv Sharma
Sanjiv Sharma
c)
2
Madhav Institute of Technology and Science
, Gwalior, MP, India
Search for other works by this author on:
Devendra Kumar Mishra
1,a)
Arvind Kumar Upadhyay
1,b)
Sanjiv Sharma
2,c)
1
Amity School of Engineering and Technology, Amity University Madhya Pradesh
, Maharajpura Dang, Gwalior, MP, India
2
Madhav Institute of Technology and Science
, Gwalior, MP, India
AIP Conf. Proc. 2816, 110001 (2024)
Citation
Devendra Kumar Mishra, Arvind Kumar Upadhyay, Sanjiv Sharma; An efficient approach to detect conceptual level plagiarism using text mining. AIP Conf. Proc. 22 March 2024; 2816 (1): 110001. https://doi.org/10.1063/5.0188150
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