The article describes an approach to reducing the effect of artifacts on the quality of electrical impedance research based on the use of the linear regression method. The article presents a scheme and description of the operation of the EIT device software, as well as an algorithm for calculating the reconstructed conductivity field of the object under study. A new approach is proposed that allows to remove EIT image artifacts due to additional data processing using linear regression. This processing is used in addition to the previously implemented data processing using the Fourier transform or wavelet transform. The results obtained indicate a reduction in artifacts in the resulting image.

Topics
Electric measurements, Data processing, Wavelet transform, Tomography, Regression analysis
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