Assessment of software for the analysis of electron diffraction patterns obtained by transmission electron microscopy and modelling

The paper presents the results of evaluating the capabilities of methods for analysing electron diffraction patterns of polycrystalline samples obtained from nanosized materials. The advantages and disadvantages of automatic processing of diffraction patterns in the CrysTBox and ProcessDiffraction programs, semi-automatic processing using the ImageJ and DigitalMicrograph programs, as well as manual processing were determined. We investigated the possibility of identifying and indexing electron diffraction patterns obtained by modelling the crystal structure (zinc oxide, brookite) in the Electron Diffraction program, as well as using transmission electron microscopy (copper-containing nanoparticles). The possibilities of recognizing diffraction rings using the indicated methods are estimated. The accuracy of measuring interplanar distances and indexing reflections has been established. The possibilities of determining the correspondence of the crystal structure to a substance are considered. The drawbacks of setting the display of analysis results, which affect the possibility of their publication, are noted. Recommendations are given for further research in the framework of this topic.