The results of terahertz time-domain spectroscopy are reported for thin-film Bi, Sb and Bi1−xSbx solid solutions. The influence of film thickness and Sb content on the properties of semimetallic thin films and semimetal film/dielectric substrate structures is studied. It is shown that such semimetal/dielectric structures exhibit hyperbolic permittivity dispersion at low terahertz frequencies, and their effective refractive index can reach values less than 1 and even less than 0. These materials may be used for development of various electronic and optical components which can control the properties of terahertz radiation.
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