Even though, innumerable approaches have been proposed for holistic face recognition, problems caused by occlusions received less attention in the literature. However, partial faces frequently appear in many real time situations. Facial occlusions (by sunglasses, hat/cap, scarf, and beard) can significantly deteriorate the performances of face recognition systems under unconstrained scenarios. In such situations, algorithms developed under holistic face, results in catastrophic performance. In this paper, we have proposed a scale and rotation invariant wavelet feature transform for partial face recognition. Partial faces at different orientations are considered here for experimentation. Biorthogonal wavelet basis (4.4) is employed for obtaining the Discrete Wavelet Transform of the images. The scale invariant feature transform (SIFT) is then applied on low-low (LL) and high-high (HH) subbands of the images. Results obtained with wavelet SIFT method is compared with SIFT and appearance based face recognition technique (PCA) over (Milborrow / University of Cape Town) MUCT database. Experimental studies with 100 subjects show that the proposed method improves recognition accuracy and reduces false acceptance rate (FAR) and false rejection rate (FRR).
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15 April 2020
PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON MICROELECTRONICS, SIGNALS AND SYSTEMS 2019
27–28 September 2019
Kollam, India
Research Article|
April 15 2020
Efficient wavelet based scale invariant feature transform for partial face recognition
S. M. Anzar;
S. M. Anzar
a)
1)
Dept. of Electronics & Communication Engineering, T.K.M. College of Engineering
, Kollam, Kerala, India
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T. Amrutha
T. Amrutha
2)
Dept. of Electronics & Communication Engineering, M.E.S. College of Engineering Kuttippuram
, Malappuram, Kerala, India
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AIP Conf. Proc. 2222, 030017 (2020)
Citation
S. M. Anzar, T. Amrutha; Efficient wavelet based scale invariant feature transform for partial face recognition. AIP Conf. Proc. 15 April 2020; 2222 (1): 030017. https://doi.org/10.1063/5.0004581
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