We report the single crystal growth and X-ray diffraction characterization of bulk Sb2Te3 single crystal. Single crystal of Sb2Te3 was grown by modified Bridgman method. The diffraction peaks corresponding to {0, 0, 3} planesreveal the growth of crystal along the c-direction. X-ray diffraction analysis by rietveld refinement confirms and verifies the phase purity, rhombohedral structure and single crystalline nature of the prepared Sb2Te3 crystal. Unit cell structure of Sb2Te3 consist of three quintuple layers stacked one above the other.

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