Growth and characterization of spray deposited strontium doped tin oxide thin films is presented. Strontium doped tin oxide films are polycrystalline with tetragonal structure. The films are uniform, crack-free and have relatively smooth surface. Spectroscopic ellipsometry analysis shows red shift in the optical band gap and decrease in refractive index upto 1% strontium doping.

Topics
Doping, Band gap, Doppler effect, Polycrystalline material, Thin films, Optical metrology, Chemical elements
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© 2019 Author(s).
2019
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