Structural, magnetic and surface morphological study of Ni doped SnO₂ thin films Available to Purchase

Nanocrystalline thin films of Sn_1-xNi_xO₂ (x=0% and 10%) were grown by pulse laser deposition technique on LaAlO₃(100) substrate and then characterize using various techniques. Single phase nature of the films has been studied using X-ray diffraction, which clearly infer that all films have single phase polycrystalline nature and exclude the presence of any secondary phase. The Surface morphological have been studied using atomic force microscopy (AFM), which revealsthat pure and Ni doped SnO₂ films are composed of nano-crystalline grains. The surface roughness measured using AFM micrographs found to increase with Ni doping. DC magnetization measurements performed at room temperature showed that undoped and doped films exhibit the FM ordering at room temperature.