Conventional optical spectroscopy is limited by the diffraction limit which impose the condition of spatial resolution to be achieved ≤ λ/2. Near field optical microscopic techniques such as near field scanning optical microscopy (NSOM) and tip enhanced Raman spectroscopy (TERS) improves the spatial resolution by utilizing the evanescent field. Here, we studied the near field light matter interaction of InN nanostructures using the NSOM technique and achieved a spatial resolution of ~ 50 nm with 150 nm aperture tip and 532 nm light source. The optical contrast in the NSOM images is attributed to the local variation of dielectric constant of individual nanostructures. TERS imaging is performed with an atomic force microscopy (AFM) tip attached with a 300 nm Au particle to achieve a sub-diffraction spatial resolution of ∼200 nm using 785 nm laser excitation.

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