Precise mass detectors based on an amorphous carbon nanowires, which localized on the top of a tungsten tip were fabricated and investigated. The nanowires were grown in the scanning electron microscope (SEM) chamber using focused electron beam technique. The movement trajectories and amplitude-frequency characteristics of the carbon nanowire oscillators were visualized at low and ambient pressure using SEM and confocal laser scanning microscope (CLSM), respectevely. The SiO2 and TiO2 nanospheres were clamped on the top of the carbon nanowires. The manipulations of nanospheres were provided by means of dielectrophoretic force in SEM. The sensitivity of the mass detector based on the carbon nanowire oscillator was estimated.

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