Novel techniques for the epitaxial growth of silicon have been developed using mercury‐sensitized photochemical vapor deposition and plasma chemical vapor deposition. Specular epitaxial silicon films were grown on (100)‐oriented Si substrates at growth temperatures of between 100°C to 300°C by the photochemical or glow discharge decomposition of a gas mixture consisting of either Si2H6+SiH2F2+H2 or SiH4+SiH2F2+H2. It was found that an addition of SiH2F2 gas to the reactant gases and a high dilution ratio of Si2H6 (or SiH4) to H2 were essential for this very low‐temperature silicon epitaxy. Furthermore, silicon epitaxy at between 600–700°C has been demonstrated by the ArF or XeF excimer laser induced photochemical vapor deposition technique. Improvements in both the film crystallinity and electrical properties were produced by laser irradiation.
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15 September 1988
Deposition and Growth: Limits for Microelectronics
3-5 November 1987
Anaheim, CA, USA
Research Article|
September 15 1988
Low temperature silicon epitaxy by photo‐ and plasma‐CVD
A. Yamada;
A. Yamada
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2‐12‐1, Ohokayama, Meguro‐ku, Tokyo 152, Japan
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A. Satoh;
A. Satoh
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2‐12‐1, Ohokayama, Meguro‐ku, Tokyo 152, Japan
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M. Konagai;
M. Konagai
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2‐12‐1, Ohokayama, Meguro‐ku, Tokyo 152, Japan
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K. Takahashi
K. Takahashi
Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2‐12‐1, Ohokayama, Meguro‐ku, Tokyo 152, Japan
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AIP Conf. Proc. 167, 222–236 (1988)
Citation
A. Yamada, A. Satoh, M. Konagai, K. Takahashi; Low temperature silicon epitaxy by photo‐ and plasma‐CVD. AIP Conf. Proc. 15 September 1988; 167 (1): 222–236. https://doi.org/10.1063/1.37151
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