In the present paper, we focus our attention on Altham’s multiplicative binomial model under the Bayesian perspective, modeling both the probability of success and the dispersion parameters. We present results based on a simulated data set to access the quality of Bayesian estimates and Bayesian diagnostic for model assessment.
This content is only available via PDF.
© 2012 American Institute of Physics.
2012
American Institute of Physics
You do not currently have access to this content.