A study of the applicability of ZnO thin-films as anti-reflection coating on Cu₂ZnSnS₄ thin-films solar cell

Transparent ZnO thin-films are prepared using the RF magnetron sputtering and spray pyrolysis techniques on the glass substrates. Reflectance spectra and thin films heights are measured using spectrophotometer and stylus surface profiler, respectively. Measured optical data is used for investigating the effect of the ZnO prepared by above two processes on the performance of Cu₂ZnSnS₄ (CZTS) thin films solar cell (TFSC). One dimensional simulation approach is considered using the simulation program, SCAPS. External quantum efficiency and J-V characteristics of CZTS TFSC is simulated on the basis of optical reflectance data of ZnO films with and without ZnO thin-films as antireflection coating (ARC). Study shows that ARC coated CZTS TFSC provides a better fill factor (FF) as compared to other ARC material such as MgF₂. Sprayed ZnO thin-films as ARC show comparable performance with the sputtered samples.