GIXRD measurements at EDXRD beamline at INDUS-2 synchrotron Available to Purchase

The energy dispersive x-ray diffraction (EDXRD) beam line at beam port no. BL-11, INDUS-2, RRCAT (Indore) has been adapted for grazing incidence x-ray diffraction (GIXRD) measurements in both out-of plane and in-plane geometry. With the help of energy sensitive high resolution HPGe detector, we have been able to record diffraction data from thin films of thicknesses ranging from few nanometers to hundreds of nanometers. We are presenting here a few demonstrative examples to illustrate the capabilities and possible implications of EDXRD beamline in carrying out structural investigations of thin films.