Spider and BICEP2/Keck are projects to study the polarization of the cosmic microwave background (CMB). The focal planes for both require large format arrays of superconducting transition edge sensors (TES’s). A major challenge for these projects is fabricating arrays with high uniformity in device parameters. A microfabrication process is described that meets this challenge. The results from device testing are discussed. Each focal plane is composed of 4 square wafers (tiles), and each wafer contains 128 membrane‐isolated, polarization‐sensitive, antenna‐coupled TES's. After processing, selected wafers are pre‐screened in a quick‐turn‐around, cryogen‐free, fridge. The pre‐screening is performed with a commercial resistance bridge and measures transition temperatures and normal state resistances After pre‐screening, 4 tiles at a time are fully characterized in a testbed employing a SQUID readout and SQUID mulitplexing. The tests demonstrate the values of thermal conductance, g, and the standard deviations of each, across a wafer and from wafer to wafer, are within design specifications.
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16 December 2009
THE THIRTEENTH INTERNATIONAL WORKSHOP ON LOW TEMPERATURE DETECTORS—LTD13
20–24 July 2009
Stanford (California)
Research Article|
December 16 2009
Microfabrication and Device Parameter Testing of the Focal Plane Arrays for the Spider and BICEP2/Keck CMB Polarimeters Available to Purchase
J. A. Bonetti;
J. A. Bonetti
aJet Propulsion Laboratory, California Institute of Technology
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A. D. Turner;
A. D. Turner
aJet Propulsion Laboratory, California Institute of Technology
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M. Kenyon;
M. Kenyon
aJet Propulsion Laboratory, California Institute of Technology
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A. Orlando;
A. Orlando
bDepartment of Physics, California Institute of Technology
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J. A. Brevik;
J. A. Brevik
bDepartment of Physics, California Institute of Technology
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A. Trangsrud;
A. Trangsrud
bDepartment of Physics, California Institute of Technology
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R. Sudiwala;
R. Sudiwala
bDepartment of Physics, California Institute of Technology
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H. G. LeDuc;
H. G. LeDuc
aJet Propulsion Laboratory, California Institute of Technology
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H. T. Nguyen;
H. T. Nguyen
aJet Propulsion Laboratory, California Institute of Technology
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P. K. Day;
P. K. Day
aJet Propulsion Laboratory, California Institute of Technology
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J. J. Bock;
J. J. Bock
aJet Propulsion Laboratory, California Institute of Technology
bDepartment of Physics, California Institute of Technology
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S. R. Golwala;
S. R. Golwala
bDepartment of Physics, California Institute of Technology
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J. Sayers;
J. Sayers
bDepartment of Physics, California Institute of Technology
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J. M. Kovac;
J. M. Kovac
bDepartment of Physics, California Institute of Technology
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A. E. Lange;
A. E. Lange
bDepartment of Physics, California Institute of Technology
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W. C. Jones;
W. C. Jones
cDepartment of Physics, Princeton University
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C. L Kuo
C. L Kuo
dDepartment of Physics, Stanford University
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J. A. Bonetti
a
A. D. Turner
a
M. Kenyon
a
A. Orlando
b
J. A. Brevik
b
A. Trangsrud
b
R. Sudiwala
b
H. G. LeDuc
a
H. T. Nguyen
a
P. K. Day
a
J. J. Bock
a,b
S. R. Golwala
b
J. Sayers
b
J. M. Kovac
b
A. E. Lange
b
W. C. Jones
c
C. L Kuo
d
aJet Propulsion Laboratory, California Institute of Technology
bDepartment of Physics, California Institute of Technology
cDepartment of Physics, Princeton University
dDepartment of Physics, Stanford University
AIP Conf. Proc. 1185, 367–370 (2009)
Citation
J. A. Bonetti, A. D. Turner, M. Kenyon, A. Orlando, J. A. Brevik, A. Trangsrud, R. Sudiwala, H. G. LeDuc, H. T. Nguyen, P. K. Day, J. J. Bock, S. R. Golwala, J. Sayers, J. M. Kovac, A. E. Lange, W. C. Jones, C. L Kuo; Microfabrication and Device Parameter Testing of the Focal Plane Arrays for the Spider and BICEP2/Keck CMB Polarimeters. AIP Conf. Proc. 16 December 2009; 1185 (1): 367–370. https://doi.org/10.1063/1.3292354
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