We have been developing a cryogenic ASIC for high impedance terahertz detectors. The ASIC is made up of depletion and enhancement n‐type GaAs‐JFETs produced by SONY, which have excellent performance even at less than 1 K. The ASIC needs high precision and low power preamplifiers. However, the previous design could not satisfy the requirement on the open loop gain. So, we designed and fabricated new 6 and 16‐channel reset integrating amplifiers whose open loop gains are more than 2000. Each preamplifier consists of a common source amplifier, a cascode amplifier with active load and source follower buffers. We measured one of the cascode amplifiers, which is the improved part of the new preamplifier. The test results showed that the gain and the power consumption were 560 and 1.1 μW. Considering the gain of the first stage common source amplifier is ∼10, the open loop gain of the preamplifier will achieve the requirement value.
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16 December 2009
THE THIRTEENTH INTERNATIONAL WORKSHOP ON LOW TEMPERATURE DETECTORS—LTD13
20–24 July 2009
Stanford (California)
Research Article|
December 16 2009
Development of cryogenic analog amplifiers based on GaAs‐JFET technology for high impedance array sensors
Hirohisa Nagata;
Hirohisa Nagata
aInstitute of Space and Astronautical Science, 3‐1‐1 Yoshinodai, Sagamihara, Kanagawa 229‐8510, Japan
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Hiroshi Matsuo;
Hiroshi Matsuo
bNational Astronomical Observatory of Japan, 2‐21‐1, Osawa, Mitaka, Tokyo 181‐8588, Japan
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Yasunori Hibi;
Yasunori Hibi
bNational Astronomical Observatory of Japan, 2‐21‐1, Osawa, Mitaka, Tokyo 181‐8588, Japan
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Hirokazu Ikeda;
Hirokazu Ikeda
aInstitute of Space and Astronautical Science, 3‐1‐1 Yoshinodai, Sagamihara, Kanagawa 229‐8510, Japan
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Mikio Fujiwara
Mikio Fujiwara
cNational Institute of Information and Communications Technology, 4‐2‐1 Nukui‐Kitamachi, Koganei, Tokyo 184‐8795, Japan
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AIP Conf. Proc. 1185, 115–118 (2009)
Citation
Hirohisa Nagata, Hiroshi Matsuo, Yasunori Hibi, Hirokazu Ikeda, Mikio Fujiwara; Development of cryogenic analog amplifiers based on GaAs‐JFET technology for high impedance array sensors. AIP Conf. Proc. 16 December 2009; 1185 (1): 115–118. https://doi.org/10.1063/1.3292296
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