Jefferson Lab uses 100 kV DC high voltage photoguns with high polarization strained superlattice GaAs photocathodes to achieve electron beam polarization over 80%. The photocathode is subjected to back‐bombardment from ionized residual gasses during operation. We present surface analyses using transmission electron microscopy (TEM) and secondary ion mass spectrometry (SIMS) to characterize photocathode damage.

Topics
Superlattices, Photocathodes, Secondary ion mass spectrometry, Transmission electron microscopy, Electron beams
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© 2009 American Institute of Physics.
2009
American Institute of Physics
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