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Journal Articles

All-solid-state AlGaN/GaN-based ion-sensitive heterostructure field effect transistor pH sensor microprobe encapsulated in medical needle

Open Access
Fengge Wang, Minjie Zhang, Honghui Liu, Yanyan Xu, Zhiwen Liang, Junyu Shen, Zhengwen Xiao, Chaokun Yan, Zhisheng Wu, Yang Liu, Baijun Zhang
Journal: AIP Advances
AIP Advances 12, 095013 (2022)
https://doi.org/10.1063/6.0001960
Published: September 2022
View articletitled, All-solid-state AlGaN/GaN-based ion-sensitive heterostructure field effect transistor pH sensor microprobe encapsulated in medical needle
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Journal Articles

A closed-loop constant deposition current control method based on MCED circuit model

Open Access
Xiaobo Liao, Jian Zhuang, Yalou Deng, Zhiwu Wang, Qiangqiang Zheng, Yong Cai, Xingyuan Lu
Journal: AIP Advances
AIP Advances 10, 045118 (2020)
https://doi.org/10.1063/1.5133878
Published: April 2020
View articletitled, A closed-loop constant deposition current control method based on MCED circuit model
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Journal Articles

Enhanced radiation hardness and signal recovery in thin diamond detectors

Open Access
N. Skukan, I. Sudić, M. Pomorski, W. Kada, M. Jakšić
Journal: AIP Advances
AIP Advances 9, 025027 (2019)
https://doi.org/10.1063/1.5081136
Published: February 2019
View articletitled, Enhanced radiation hardness and signal recovery in thin diamond detectors
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Journal Articles

Annealing effects on recombinative activity of nickel at direct silicon bonded interface

Open Access
Takuto Kojima, Yoshio Ohshita, Masafumi Yamaguchi
Journal: AIP Advances
AIP Advances 5, 097140 (2015)
https://doi.org/10.1063/1.4931083
Published: September 2015
View articletitled, Annealing effects on recombinative activity of nickel at direct silicon bonded interface
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Journal Articles

Low-temperature fabrication of solution-processed InZnO thin-film transistors with Si impurities by UV/O3-assisted annealing

Open Access
Li Lu, Masahiro Echizen, Takashi Nishida, Yasuaki Ishikawa, Kiyoshi Uchiyama, Yukiharu Uraoka
Journal: AIP Advances
AIP Advances 2, 032111 (2012)
https://doi.org/10.1063/1.4739052
Published: July 2012
View articletitled, Low-temperature fabrication of solution-processed InZnO thin-film transistors with Si impurities by UV/O3-assisted annealing
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