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Determination of the interface between amorphous insulator and crystalline 4H–SiC in transmission electron microscope image by using convolutional neural network

AIP Advances 11, 015101 (2021)
This article has been cited by the following articles in journals that are participating in CrossRef Cited-by Linking.
  • Kevin P Treder
  • Chen Huang
  • Judy S Kim
  • Angus I Kirkland
Microscopy 71, i100 (2022)
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