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Journal Articles

Interface defects in SiC power MOSFETs - An electrically detected magnetic resonance study based on spin dependent recombination

Gernot Gruber, Peter Hadley, Markus Koch, Dethard Peters, Thomas Aichinger
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1583, 165–168 (2014)
https://doi.org/10.1063/1.4865627
Published: February 2014
View article titled, Interface defects in SiC power MOSFETs - An electrically detected magnetic resonance study based on spin dependent recombination
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Journal Articles

Electrically-detected magnetic resonance in semiconductor nanostructures inserted in microcavities

Nikolay Bagraev, Eduard Danilovskii, Wolfgang Gehlhoff, Dmitrii Gets, Leonid Klyachkin, Andrey Kudryavtsev, Roman Kuzmin, Anna Malyarenko, Vladimir Mashkov, Vladimir Romanov
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1566, 25–26 (2013)
https://doi.org/10.1063/1.4848267
Published: December 2013
View article titled, Electrically-detected magnetic resonance in semiconductor nanostructures inserted in microcavities
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