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Journal Articles

Design and simulation study of effect of channel length, source/drain material, source/drain concentration on graphene based field effect transistor (GFET)

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Neha Gupta, Manoj Kumar
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2916, 110002 (2023)
https://doi.org/10.1063/5.0177639
Published: December 2023
View article titled, Design and simulation study of effect of channel length, source/drain material, source/drain concentration on graphene based field effect transistor (GFET)
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Journal Articles

Comparison of V-I characteristics between MOSFET and MESFET by varying channel length

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Chandaka Akhil, Bhaskarrao Yakkala
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2822, 020088 (2023)
https://doi.org/10.1063/5.0172901
Published: November 2023
View article titled, Comparison of V-I characteristics between MOSFET and MESFET by varying channel length
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Journal Articles

Comparison of VI characteristics between conventional MOSFET and nanoscale MOSFET based on its drain characteristics

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Sangireddy Harinath Reddy, Bhaskarrao Yakkala
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2655, 020077 (2023)
https://doi.org/10.1063/5.0119138
Published: May 2023
View article titled, Comparison of VI characteristics between conventional MOSFET and nanoscale MOSFET based on its drain characteristics
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Journal Articles

Area efficient multiplier using NANO CMOS logic style

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S. Sasikala, S. Gomathi, M. Chitra, S. R. Nandhini
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2387, 090001 (2021)
https://doi.org/10.1063/5.0068616
Published: November 2021
View article titled, Area efficient multiplier using NANO CMOS logic style
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Journal Articles

Study the effect of channel doping concentration on electrical properties of SOI MOSFET using Silvaco TCAD simulator

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Mohd Shahrul Ashraf Bustam, Nur Sa’adah Muhamad Sauki, Lyly Nyl Ismail, Norsabrina Sihab, Faridah Abdul Razak, Nur Amalina Muhamad
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2306, 020005 (2020)
https://doi.org/10.1063/5.0033565
Published: December 2020
View article titled, Study the effect of channel doping concentration on electrical properties of SOI MOSFET using Silvaco TCAD simulator
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Journal Articles

Modeling, optimization and comprehensive comparative analysis of 7nm FinFET and 7nm GAAFET devices

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Rakesh Yerragopu, Dr. P. Aruna Priya, J. K. Kasthuribha
Journal: AIP Conference Proceedings
AIP Conf. Proc. 2277, 020003 (2020)
https://doi.org/10.1063/5.0027162
Published: November 2020
View article titled, Modeling, optimization and comprehensive comparative analysis of 7nm FinFET and 7nm GAAFET devices
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Journal Articles

The development of 8 inch roll-to-plate nanoimprint lithography (8-R2P-NIL) system

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Lai Seng Lee, Khairudin Mohamed, Su Guan Ooi
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1865, 020005 (2017)
https://doi.org/10.1063/1.4993324
Published: July 2017
View article titled, The development of 8 inch roll-to-plate nanoimprint lithography (8-R2P-NIL) system
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Journal Articles

A comparative analysis of electronic and molecular quantum dot cellular automata

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H. Umamahesvari, D. Ajitha
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1665, 050073 (2015)
https://doi.org/10.1063/1.4917714
Published: June 2015
View article titled, A comparative analysis of electronic and molecular quantum dot cellular automata
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Journal Articles

Framework for scheduling and resource management in time-constrained HPC application

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Antoni Portero, Stepan Kuchar, Radim Vavrik, Martin Golasowski, Giuseppe Massari, William Fornaciari, Vit Vondrak
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1648, 830013 (2015)
https://doi.org/10.1063/1.4913039
Published: March 2015
View article titled, Framework for scheduling and resource management in time-constrained HPC application
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Journal Articles

Novel developments in rapid thermal processing (RTP) temperature measurement and control

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B. E. Adams, A. M. Hunter
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1552, 909–914 (2013)
https://doi.org/10.1063/1.4819665
Published: September 2013
View article titled, Novel developments in rapid thermal processing (RTP) temperature measurement and control
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Journal Articles

Frontiers of More than Moore in Bioelectronics and the Required Metrology Needs

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Anthony Guiseppi‐Elie, Christian Kotanen, A. Nolan Wilson
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1395, 360–369 (2011)
https://doi.org/10.1063/1.3657915
Published: November 2011
View article titled, Frontiers of More than Moore in Bioelectronics and the Required Metrology Needs
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Journal Articles

Nanocharacterization Challenges in a Changing Microelectronics Landscape

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Michel Brilloüt
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1395, 15–23 (2011)
https://doi.org/10.1063/1.3657861
Published: November 2011
View article titled, Nanocharacterization Challenges in a Changing Microelectronics Landscape
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Journal Articles

Positioning More Than Moore Characterization Needs and Methods within the 2011 ITRS

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Mart Graef
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1395, 345–350 (2011)
https://doi.org/10.1063/1.3657913
Published: November 2011
View article titled, Positioning More Than Moore Characterization Needs and Methods within the 2011 ITRS
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Journal Articles

Sub‐imaging Techniques For 3D‐Interconnects On Bonded Wafer Pairs

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Lay Wai Kong, Peter Krueger, Ehrenfried Zschech, Andrew C. Rudack, Sitaram Arkalgud, Alain C. Diebold
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1300, 221–228 (2010)
https://doi.org/10.1063/1.3527129
Published: November 2010
View article titled, Sub‐imaging Techniques For 3D‐Interconnects On Bonded Wafer Pairs
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Journal Articles

Characterization of MOSFET‐like Carbon Nanotube Field Effect Transistor

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A. M. Hashim, H. H. Ping, C. Y. Pin
Journal: AIP Conference Proceedings
AIP Conf. Proc. 1217, 11–18 (2010)
https://doi.org/10.1063/1.3377796
Published: March 2010
View article titled, Characterization of MOSFET‐like Carbon Nanotube Field Effect Transistor
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Journal Articles

The Economics of van der Waals Force Engineering

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Fabrizio Pinto
Journal: AIP Conference Proceedings
AIP Conf. Proc. 969, 959–968 (2008)
https://doi.org/10.1063/1.2845064
Published: January 2008
View article titled, The Economics of van der Waals Force Engineering
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Journal Articles

New Materials and Structures for Transistors based on Spin, Charge and Wavefunction Phase Control

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Sanjay Banerjee
Journal: AIP Conference Proceedings
AIP Conf. Proc. 931, 445–448 (2007)
https://doi.org/10.1063/1.2799415
Published: September 2007
View article titled, New Materials and Structures for Transistors based on Spin, Charge and Wavefunction Phase Control
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Journal Articles

Critical Trajectories for the Human Settlement of the High Frontier

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Lee S. Valentine
Journal: AIP Conference Proceedings
AIP Conf. Proc. 886, 123–130 (2007)
https://doi.org/10.1063/1.2710049
Published: February 2007
View article titled, Critical Trajectories for the Human Settlement of the High Frontier
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Journal Articles

From The Lab to The Fab: Transistors to Integrated Circuits

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Howard R. Huff
Journal: AIP Conference Proceedings
AIP Conf. Proc. 683, 3–39 (2003)
https://doi.org/10.1063/1.1622451
Published: September 2003
View article titled, From The Lab to The Fab: Transistors to Integrated Circuits
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Journal Articles

Metrology Requirements and the Limits of Measurement Technology for the Semiconductor Industry

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Alain C. Diebold
Journal: AIP Conference Proceedings
AIP Conf. Proc. 683, 81–96 (2003)
https://doi.org/10.1063/1.1622455
Published: September 2003
View article titled, Metrology Requirements and the Limits of Measurement Technology for the Semiconductor Industry
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