Skip to Main Content
Open Menu
Close
Publishers
Open Menu
AIP Publishing
Physics Today
Acoustical Society of America
American Association of Physics Teachers
American Crystallographic Association, Inc.
AVS: Science and Technology of Materials, Interfaces and Processing
Chinese Physical Society
Hefei General Machinery Research Institute
Laser Institute of America
The Society of Rheology
Tianjin University
Publications
Open Menu
Journals
Physics Today
AIP Conference Proceedings
Books
Special Topics
Authors
Open External Link
Librarians
Open External Link
About
Search Dropdown Menu
header search
search input
Search input auto suggest
filter your search
All Content
AIP Publishing Portfolio
AIP Conference Proceedings
Search
Advanced Search
|
Citation Search
User Tools Dropdown
Sign In
Open Menu
Toggle Menu
Menu
Home
Browse
Open Menu
Newest Issue
All Issues
For Authors
Open Menu
Preparing Your Manuscript
Re-use of Proceedings Articles
Publication Charges
Author Resources
Open External Link
AIP Author Services
Open External Link
Post Publication Policy
For Organizers
Open Menu
Abstracting & Indexing
Ethics Policy
Open External Link
FAQ for Organizers
Peer Review
The Publication Process
Post Publication Policy
Testimonials from Editors & Organizers
How To Redeem Access Codes
About
Open Menu
Overview
Conference Proceedings Team
Contact
Skip Nav Destination
Multi‐Wavelength Raman and Photoluminescence Characterization of Implanted Silicon Before and After Rapid Thermal Annealing
AIP Conf. Proc.
1321, 204–207 (2011)
Currently there are no citedby results. Try again later.
Close Modal
Close Modal
This Feature Is Available To Subscribers Only
Sign In
or
Create an Account
Close Modal
Close Modal
