Ellipsometry is an optical analysis technique that is useful for characterizing the physical properties of a thin-film system. Light reflected from a sample surface undergoes a change in polarization due to phase delay and anisotropic reflection. This enables one to perform non-destructive measurements of film thickness, surface roughness, refractive index, and other optical constants. Ellipsometric techniques are particularly convenient for characterizing coatings or films in the semiconductor and optics industries. However, these techniques may be inaccessible to undergraduate students and educators due to the prohibitive cost of ellipsometers and similar instrumentation. In response to this roadblock, we describe the construction of a simple, inexpensive, manually operated, rotating analyzer ellipsometer (RAE). Required materials include a laser pointer, polarizing film, photometric detector, and a 3D-printed opto-mechanical framework, which are all readily accessible at most institutions. The instrument's performance was evaluated by comparing thickness measurements of tetraethyl orthosilicate films to those determined by a commercially available reflectometer. An average film thickness difference of 0.77% was measured using the two instruments.
Skip Nav Destination
Optical measurements on a budget: A 3D-printed ellipsometer
Article navigation
June 2022
PAPERS|
June 01 2022
Optical measurements on a budget: A 3D-printed ellipsometer
Matthew Mantia;
Matthew Mantia
a)
Department of Chemistry, Lewis University
, Romeoville, Illinois 60446
Search for other works by this author on:
Teresa Bixby
Teresa Bixby
b)
Department of Chemistry, Lewis University
, Romeoville, Illinois 60446
Search for other works by this author on:
a)
Electronic mail: [email protected]
b)
Electronic mail: [email protected]
Am. J. Phys. 90, 445–451 (2022)
Article history
Received:
February 05 2021
Accepted:
February 13 2022
Citation
Matthew Mantia, Teresa Bixby; Optical measurements on a budget: A 3D-printed ellipsometer. Am. J. Phys. 1 June 2022; 90 (6): 445–451. https://doi.org/10.1119/10.0009665
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
Ergodic Lagrangian dynamics in a superhero universe
I. L. Tregillis, George R. R. Martin
A simple Minkowskian time-travel spacetime
John D. Norton
All objects and some questions
Charles H. Lineweaver, Vihan M. Patel
Kepler's Moon puzzle—A historical context for pinhole imaging
Thomas Quick, Johannes Grebe-Ellis
The surprising subtlety of electrostatic field lines
Kevin Zhou, Tomáš Brauner
The most efficient thermodynamic cycle under general engine constraints
Christopher Ong, Shaun Quek
Related Content
Measuring Speed (In)dependence of Dry Sliding Friction
Phys. Teach. (December 2024)
Introduction to semiconductor processing: Fabrication and characterization of p-n junction silicon solar cells
Am. J. Phys. (October 2018)