Atomic force microscopes are a key tool in nanotechnology that overcome the limitations of optical microscopes and provide imaging capabilities with nanoscale resolution. We have developed an atomic force microscope that uses an inexpensive quartz tuning fork as a micro cantilever. Because of its ease of operation and its open structure, it can be easily customized by students. Due to its low costs, it is possible that every student in the course has access to one setup, allowing all students to obtain deep insights into nanotechnology and to understand the principles of atomic force microscopy.

1.
G.
Binnig
,
C. F.
Quate
,
C.
Gerber
,
G.
Binnig
, and
H.
Rohrer
, “
Atomic force microscopy
,”
Phys. Rev. Lett.
56
(
9
),
930
933
(
2010
).
2.
A.
Bergmann
,
D.
Feigl
,
D.
Kuhn
,
M.
Schaupp
,
G.
Quast
,
K.
Busch
,
L.
Eichner
, and
J.
Schumacher
, “
A low-cost AFM setup with an interferometer for undergraduates and secondary-school students
,”
Eur. J. Phys.
34
(
4
),
901
914
(
2013
).
3.
H.
Baocheng
,
Q.
Jianqiang
, and
Y.
Junen
, “
Design and simulation of state-oscillated tapping mode atomic force microscope
,”
J. Chin. Electron Microsc. Soc.
30
(
1
),
1
6
(
2011
); available at http://en.cnki.com.cn/Article_en/CJFDTotal-DZXV201101002.htm.
4.
J.
Sharu
,
L.
Xiaofeng
,
L.
Yingzi
,
Q.
Jianqiang
, and
L.
Yuan
, “
A simulation platform of atomic force microscope based on piezoelectric hysteresis model
,”
Coll. Phys.
31
(
1
),
58
61
(
2012
); available at http://en.cnki.com.cn/Article_en/CJFDTotal-DXWL201201016.htm.
5.
L.
Xiaofeng
,
J.
Sharu
,
Z.
Liyuan
,
Q.
Jianqiang
,
L.
Yuan
, and
L.
Yingzi
, “
A simulation platform for amplitude modulation atomic force microscope
,”
Coll. Phys.
30
(
7
),
51
55
(
2011
); available at http://en.cnki.com.cn/Article_en/CJFDTotal-DXWL201107015.htm.
6.
Z.
Weiran
,
L.
Yingzi
,
W.
Xi
,
W.
Wei
, and
Q.
Jianqiang
, “
Characterization of elastic properties of a sample by atomic force microscope higher harmonic amplitude
,”
Acta Phys. Sin.
62
(
14
),
109
115
(
2013
).
7.
Y.
Haiyan
,
W.
Zhenyu
,
L.
Yingzi
,
Z.
Weiran
, and
Q.
Jianqiang
, “
Investigation of enhancing higher harmonics by changing the shape of atomic force microscope cantilever
,”
Acta Phys. Sin.
62
(
20
),
125
130
(
2013
).
8.
J.
Friedt
and
A.
Carry
, “
Introduction to the quartz tuning fork
,”
Am. J. Phys.
75
(
5
),
415
422
(
2007
).
9.
R.
Garcia
and
R.
Pérez
, “
Dynamic atomic force microscopy methods
,”
Surf. Sci. Rep.
47
(
6
),
197
301
(
2002
).
10.
L.
Yingzi
,
L.
Jin
,
Q.
Jianqiang
, and
L.
Hua
, “
Preparation of probe for atomic force microscope based on electrochemical etching
,”
Exp. Technol. Manage.
31
(
3
),
31
35
(
2014
); availabel at http://en.cnki.com.cn/Article_en/CJFDTotal-SYJL201403009.htm.
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