In this short Note we report a method for producing samples containing two nano-sized slits suitable for demonstrating to undergraduate and graduate students the double-slit electron interference experiment in a conventional transmission electron microscope.

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6.

FIB systems are increasingly widespread in academic facilities devoted to micro-fabrication, material science, or electron microscopy. Many of these laboratories, but also FIB manufacturers or private laboratories on microelectronics diagnostics, offer FIB service activity to external users.

7.
SPI Supplies (http://www.2spi.com), product number 4091SN-BA.
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