A ray tracing approach to thin lens analysis, based on a vector form of Snell’s law for paraxial rays, is proposed as an alternative to the usual approach in introductory physics courses. The ray tracing approach accommodates skew rays and thus provides a complete analysis.

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Suitable values for an initial discussion are n=1.5,R1=20 cm,R2=30 cm,p=60 cm,h=2icm, and r=(0.8i+0.6j) cm, where i and j are unit vectors in the x and y directions, respectively. Then various other values of r, with different directions and magnitudes, should be investigated.
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